| Наименование марки: | ZMSH |
| MOQ: | 10 |
| Время доставки: | 2-4 недели |
| Условия оплаты: | Т/Т |
ZMSH supplies high-quality WS₂ on Sapphire Wafers featuring continuous multilayer tungsten disulfide (WS₂) films grown on sapphire substrates. As a representative Transition Metal Dichalcogenide (TMD) material, WS₂ has attracted significant attention for next-generation electronics, optoelectronics, photodetectors, sensors, and advanced semiconductor research.
Our WS₂ wafers offer excellent crystal quality, high film uniformity, smooth surface morphology, and strong optical performance, making them ideal for universities, research institutes, semiconductor laboratories, and R&D projects worldwide.
| Parameter | Specification |
|---|---|
| Product Name | WS₂ on Sapphire Wafer |
| Material | Tungsten Disulfide (WS₂) |
| Material Type | 2D Semiconductor / TMD Material |
| Substrate | Sapphire (Al₂O₃) |
| Wafer Size | 2 inch, 4 inch |
| Film Structure | Multilayer Continuous WS₂ Film |
| Crystal Structure | Hexagonal |
| Crystal Quality | Single-Crystal Characteristics |
| Surface Roughness | RMS ≈ 0.11 nm |
| Uniformity | Wafer-Level Uniformity |
| Characterization | AFM, Raman, PL, PL Mapping, TEM, GIXRD, GI-WAXS |
| Customization | Available |
WS₂ combines a suitable bandgap, strong light-matter interaction, and excellent carrier transport properties, making it one of the most promising 2D semiconductor materials beyond conventional silicon technologies.
The sapphire substrate provides:
Compared with mechanically exfoliated flakes, wafer-scale WS₂ films provide better consistency, repeatability, and scalability for research and device development.
Atomic Force Microscopy (AFM) measurements show an ultra-smooth surface with RMS roughness around 0.11 nm, suitable for nanoscale device fabrication.
Advanced characterization techniques including GIXRD and GI-WAXS confirm high crystal quality and excellent in-plane orientation.
Strong photoluminescence (PL) intensity and narrow FWHM indicate superior optical quality and material uniformity.
Raman spectroscopy confirms the characteristic vibrational modes of WS₂, validating material composition and structural integrity.
Fundamental studies of carrier transport, electronic properties, and low-dimensional materials.
Suitable for photodetectors, optical sensors, light-emitting devices, and optical modulation research.
Research platform for next-generation transistor architectures and ultra-thin semiconductor channels.
Emerging material candidate for future computing hardware and novel device structures.
High surface sensitivity enables gas detection and environmental monitoring applications.
Suitable for biochemical sensing and medical diagnostic research.
Can be used as a growth and transfer platform for flexible electronic device development.
Widely used by universities, national laboratories, and semiconductor research institutes.
| Product | Wafer Size |
| WS₂ on Sapphire Wafer | 2 Inch |
| WS₂ on Sapphire Wafer | 4 Inch |
| Research Grade WS₂ Wafer | Custom |
| Customized WS₂ Wafer | Custom |
ZMSH provides customized WS₂ wafer solutions based on customer requirements:
Please contact us for custom requirements and project discussions.
WS₂ (Tungsten Disulfide) is a two-dimensional semiconductor belonging to the Transition Metal Dichalcogenide (TMD) family. It exhibits excellent optical and electronic properties for next-generation semiconductor applications.
Sapphire offers excellent thermal stability, optical transparency, chemical resistance, and mechanical strength, making it an ideal substrate for high-quality WS₂ growth.
Standard sizes include 2-inch and 4-inch wafers. Custom sizes can be provided upon request.
Yes. AFM, Raman, PL, PL Mapping, TEM, GIXRD, and GI-WAXS reports are available depending on project requirements.
Yes. We support customized substrate types, wafer sizes, film thicknesses, and research-grade specifications.